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Rapid embedded system testing using verification patterns

  • Wei Tek Tsai*
  • , Lian Yu
  • , Feng Zhu
  • , Raymond Paul
  • *此作品的通讯作者
  • Arizona State University
  • University of Minnesota Twin Cities
  • Boston Scientific Corporation
  • United States Department of Defense

科研成果: 期刊稿件文章同行评审

摘要

A verification pattern approach for rapidly testing real-time embedded systems first classifies system scenarios into patterns. For each scenario pattern, the VP approach then develops a test script template for all the scenarios belonging to that pattern. In this way, instead of developing numerous scripts to test the system, test engineers can customize and reuse a set of script templates to test the entire application, saving significant effort and time.

源语言英语
页(从-至)68-75
页数8
期刊IEEE Software
22
4
DOI
出版状态已出版 - 7月 2005
已对外发布

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