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Properties of passive film formed on 316L/2205 stainless steel by Mott-Schottky theory and constant current polarization method

  • Xue Qun Cheng*
  • , Xiao Gang Li
  • , Cui Wei Du
  • *此作品的通讯作者
  • University of Science and Technology Beijing

科研成果: 期刊稿件文章同行评审

摘要

Semiconductor properties of the passive films formed on 316L and 2205 stainless steel were studied by Electrochemical Impedance Spectroscopy (EIS) in the high-temperature acetic acid. The results showed that the corrosion resistance of 2205 was higher than that of 316L, and the passive films formed on 316L and 2205 stainless steel showed p-type and n-type semiconductor behavior, respectively. Destruction and self-repairing of passive films were studied by using the constant current polarization method. The results showed that for 316L, the self-repairing process would occur when the destruction was lower than the critical extent or it would not do; for 2205, the self-repairing process only happened in a short time when the destruction was in the same extent as 316L.

源语言英语
页(从-至)2239-2246
页数8
期刊Chinese Science Bulletin
54
13
DOI
出版状态已出版 - 7月 2009
已对外发布

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