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Process Variation-Resilient STT-MTJ based TRNG using Linear Correcting Codes

  • Beihang University

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

With the increasing applications of artificial intelligence (AI) attacks, the requirement for high-quality security system becomes urgent. True random number generator (TRNG) is the core block of many cryptographic systems, of which the security is determined by the randomness source of TRNG. In this paper, stochastic switching behavior of spin transfer torque magnetic tunnel junction (STT-MTJ) device is exploited for generation of random numbers. Stochastic switching of STT-MTJ provides an excellent physical randomness source. However, due to the limited technology and correlation between different process steps, process variation has a significant impact on the randomness of MTJ based TRNG. Therefore, post processing-based control mechanism is also necessary to guarantee reliable randomness. The method of linear corrector is integrated into STT-MTJ based TRNG, resulting in improved entropy of randomness. The design is implemented by a 40nm CMOS technology and a compact model of the MTJ. By using the output random bitstream with and without process variations, the efficiency of linear corrector is demonstrated by passing the National Institute of Standards and Technology (NIST) statistical test suite.

源语言英语
主期刊名NANOARCH 2019 - 15th IEEE/ACM International Symposium on Nanoscale Architectures, Proceedings
出版商Institute of Electrical and Electronics Engineers Inc.
ISBN(电子版)9781728155203
DOI
出版状态已出版 - 7月 2019
活动15th IEEE/ACM International Symposium on Nanoscale Architectures, NANOARCH 2019 - Qingdao, 中国
期限: 17 7月 201919 7月 2019

出版系列

姓名NANOARCH 2019 - 15th IEEE/ACM International Symposium on Nanoscale Architectures, Proceedings

会议

会议15th IEEE/ACM International Symposium on Nanoscale Architectures, NANOARCH 2019
国家/地区中国
Qingdao
时期17/07/1919/07/19

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