摘要
In this paper, it is introduced that using a cooling apparatus based on liquid nitrogen, we have prepared NiOx films with nano-microcrystalline structure by reactive magnetron sputtering. X-ray diffiration (XRD) and Images of scanning electron microscope (SEM) demonstrate that when we employ equal sputtering parameters, using this method, we can effectively regulate or control grain size of NiOx films with nano-microcrystalline structure.
| 源语言 | 英语 |
|---|---|
| 页(从-至) | 1618-1621 |
| 页数 | 4 |
| 期刊 | Gongneng Cailiao/Journal of Functional Materials |
| 卷 | 39 |
| 期 | 10 |
| 出版状态 | 已出版 - 10月 2008 |
学术指纹
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