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Posbist reliability behavior of typical systems with two types of failure

  • Cai Kai-Yuan*
  • , Wen Chuan-Yuan
  • , Zhang Ming-Lian
  • *此作品的通讯作者
  • Beihang University

科研成果: 期刊稿件文章同行评审

摘要

The posbist reliability theory is based on the possibility assumption and the binary-state assumption. In this paper we study the posbist reliability behavior, in the presence of two failure modes, for various classes of typical systems, including series systems, parallel systems, k-out-of-n systems, series-parallel systems, and parallel-series systems. It is shown that for each typical system, the posbist system reliability is bounded by the minimum and the maximum of the posbist component reliabilities.

源语言英语
页(从-至)17-32
页数16
期刊Fuzzy Sets and Systems
43
1
DOI
出版状态已出版 - 5 9月 1991

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