摘要
Posbist reliability theory is based on the possibility assumption and the binary-state assumption. In this paper we discuss posbist reliability behaviour of fault-tolerant systems, including cold redundant systems and warm redundant systems. In each type of fault-tolerant systems, the conversion switchs may behave in different ways, such as absolutely reliable, non-absolutely reliable with 0-1 mode, non-absolutely reliable with continuous mode. So the system posbist reliability behaviour varies. We express the system posbist reliability in terms of a system lifetime. When the system posbist reliability exhibits as a fuzzy variable in itself, we redefine the system posbist reliability by use of a new expression.
| 源语言 | 英语 |
|---|---|
| 页(从-至) | 49-56 |
| 页数 | 8 |
| 期刊 | Microelectronics Reliability |
| 卷 | 35 |
| 期 | 1 |
| DOI | |
| 出版状态 | 已出版 - 1月 1995 |
指纹
探究 'Posbist reliability behavior of fault-tolerant systems' 的科研主题。它们共同构成独一无二的指纹。引用此
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver