摘要
Transparent TiO2 and TiO2-xNx thin films were prepared on glass substrates by r. f. magnetron sputtering. The crystalline structure, surface morphology, photocatalysis of the films were characterized by X-ray diffraction (XRD), atomic force microscopy (AFM) and UV-Vis spectrophotometer. The results showed that most TiO2-xNx thin films were anatase phase. A new crystalline phase was found in the nitrogen-rich film. The absorption edge of thin films were shifted to the lower-energy region with increasing of N2 /Ar gas flow ratio. The nitrogen-doped TiO2 thin film prepared with 3:100 sccm N2/Ar shows better photocatalytic activity at visible light region.
| 源语言 | 英语 |
|---|---|
| 页(从-至) | 464-466 |
| 页数 | 3 |
| 期刊 | Gongneng Cailiao/Journal of Functional Materials |
| 卷 | 36 |
| 期 | 3 |
| 出版状态 | 已出版 - 3月 2005 |
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