TY - JOUR
T1 - Phase separation of PS/PVME blend films induced by capillary force
AU - Li, Xue
AU - Wang, Zhe
AU - Cui, Liang
AU - Xing, Rubo
AU - Han, Yanchun
AU - An, Lijia
PY - 2004/11/1
Y1 - 2004/11/1
N2 - The phase behavior of a miscible PS/PVME (80/20, w/w) blend film in a confined geometry has been investigated at the annealing temperature much lower than the low critical solution temperature (LCST) of the blend. When the annealing temperature (52°C) is near the glass transition temperature of the blend (51.2°C), PVME-rich phase at the air-film surface under a microchannel forms smaller protrusion. When the annealing temperature is increased to 70°C, the protruding stripes, which are almost developed, are mainly composed of the mobile PVME-rich phase. These results reveal that the capillary force lead to the enrichment of PVME-rich phase at the air-polymer interface of a PDMS microchannel, that is, the capillary force lithography (CFL) can induce the phase separation of PS/PVME blend films.
AB - The phase behavior of a miscible PS/PVME (80/20, w/w) blend film in a confined geometry has been investigated at the annealing temperature much lower than the low critical solution temperature (LCST) of the blend. When the annealing temperature (52°C) is near the glass transition temperature of the blend (51.2°C), PVME-rich phase at the air-film surface under a microchannel forms smaller protrusion. When the annealing temperature is increased to 70°C, the protruding stripes, which are almost developed, are mainly composed of the mobile PVME-rich phase. These results reveal that the capillary force lead to the enrichment of PVME-rich phase at the air-polymer interface of a PDMS microchannel, that is, the capillary force lithography (CFL) can induce the phase separation of PS/PVME blend films.
KW - Atomic force microscopy
KW - Polycrystalline thin films
KW - X-ray photoelectron spectroscopy
UR - https://www.scopus.com/pages/publications/6444220890
U2 - 10.1016/j.susc.2004.07.052
DO - 10.1016/j.susc.2004.07.052
M3 - 文章
AN - SCOPUS:6444220890
SN - 0039-6028
VL - 571
SP - 12
EP - 20
JO - Surface Science
JF - Surface Science
IS - 1-3
ER -