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Phase interrogation sensitivity analysis for surface plasmon resonance sensors

  • Zhiyou Wang
  • , Zheng Zheng
  • , Yusheng Bian
  • , Jinsong Zhu*
  • *此作品的通讯作者
  • National Center for Nanoscience and Technology
  • Beihang University

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

Sensitivity of phase interrogation using surface plasmon resonance sensors with various metal film thicknesses are analyzed at different wavelengths. Theoretical analysis reveals that reasonable sensitivities with moderate dynamic ranges can be obtained under specific configurations.

源语言英语
主期刊名Laser Science, LS 2012
出版商Optical Society of America (OSA)
ISBN(印刷版)9781557529565
DOI
出版状态已出版 - 2012
活动Laser Science, LS 2012 - Rochester, NY, 美国
期限: 14 10月 201218 10月 2012

出版系列

姓名Laser Science, LS 2012

会议

会议Laser Science, LS 2012
国家/地区美国
Rochester, NY
时期14/10/1218/10/12

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