跳到主要导航 跳到搜索 跳到主要内容

Parametric modeling of the coupling channel of conducted interference based on multi-linear regression model

  • Beihang University

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

In electromagnetic compatibility testing, the conducted electromagnetic emission (EMI) of the equipment under test (EUT) are required to meet certain standards of electromagnetic compatibility in order to control its external conducted emission. However, sometimes there is no way to eliminate the internal interference sources of EUT, so the only way to reduce the EMI is to change the coupling channel from the internal interference sources to the external test port. Therefore, it is necessary to understand the characteristic of the coupling channel, so that the EMI of the EUT can be effectively analyzed and restrained. In this paper, a frequency-domain parametric modeling method of the coupling channel based on multi-linear regression model is proposed, and an example to verify the algorithm is presented. The example shows that the modeling method can reflect the characteristic of coupling channel in frequency domain.

源语言英语
主期刊名2016 IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization, NEMO 2016
出版商Institute of Electrical and Electronics Engineers Inc.
ISBN(电子版)9781467387620
DOI
出版状态已出版 - 6 9月 2016
活动2016 IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization, NEMO 2016 - Beijing, 中国
期限: 27 7月 201629 7月 2016

出版系列

姓名2016 IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization, NEMO 2016

会议

会议2016 IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization, NEMO 2016
国家/地区中国
Beijing
时期27/07/1629/07/16

指纹

探究 'Parametric modeling of the coupling channel of conducted interference based on multi-linear regression model' 的科研主题。它们共同构成独一无二的指纹。

引用此