摘要
Ytterbium (Yb) silicide is a promising contact material due to its low contact resistance and small Schottky barrier height in contact with n -type Si. However, as one of the rare earth metals, Yb is easily oxidized during physical vapor deposition and rapid thermal annealing. In this article, a bilayered TiTiN cap is proposed and demonstrated to effectively suppress oxidation during Yb silicidation. The authors' results reveal that diffusion of Ti atoms in the TiN layer plays a key role in oxidation suppression.
| 源语言 | 英语 |
|---|---|
| 页(从-至) | 285-289 |
| 页数 | 5 |
| 期刊 | Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films |
| 卷 | 25 |
| 期 | 2 |
| DOI | |
| 出版状态 | 已出版 - 2007 |
| 已对外发布 | 是 |
指纹
探究 'Oxidation suppression in ytterbium silicidation by TiTiN bicapping layer' 的科研主题。它们共同构成独一无二的指纹。引用此
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