跳到主要导航 跳到搜索 跳到主要内容

Oxidation suppression in ytterbium silicidation by TiTiN bicapping layer

  • Yu Long Jiang*
  • , Qi Xie
  • , Christophe Detavernier
  • , R. L. Van Meirhaeghe
  • , Guo Ping Ru
  • , Xin Ping Qu
  • , Bing Zong Li
  • , Anping Huang
  • , Paul K. Chu
  • *此作品的通讯作者
  • Fudan University
  • Ghent University
  • City University of Hong Kong

科研成果: 期刊稿件文章同行评审

摘要

Ytterbium (Yb) silicide is a promising contact material due to its low contact resistance and small Schottky barrier height in contact with n -type Si. However, as one of the rare earth metals, Yb is easily oxidized during physical vapor deposition and rapid thermal annealing. In this article, a bilayered TiTiN cap is proposed and demonstrated to effectively suppress oxidation during Yb silicidation. The authors' results reveal that diffusion of Ti atoms in the TiN layer plays a key role in oxidation suppression.

源语言英语
页(从-至)285-289
页数5
期刊Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
25
2
DOI
出版状态已出版 - 2007
已对外发布

指纹

探究 'Oxidation suppression in ytterbium silicidation by TiTiN bicapping layer' 的科研主题。它们共同构成独一无二的指纹。

引用此