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Novel Latin square matrix code of large burst error correction for MRAM applications

  • Beihang University
  • North University of China

科研成果: 期刊稿件文章同行评审

摘要

With the scaling down of the technology node of complementary metal–oxide–semiconductor (CMOS), the bit error rate (BER) of magnetic random memory (MRAM) seriously threats the reliability, especially multiple-cell upset (MBUs). Error correction codes (ECCs) such as one-step majority logic decodable (OS-MLD) codes are proposed with strong error correction capabilities, and efficient hardware overhead. However, the OS-MLD codes are not suitable for the burst error correction, which require more redundancy bits or extra memory cells. A novel m order Latin square matrix (LSM) codes for MRAM are presented, which can provide fewer equivalent bits and more flexible adjustments for correcting large burst errors. The 5-bit LSM code area is only 90898.71 μm2, and the power consumption is only 0.82 mw.

源语言英语
文章编号115505
期刊Microelectronics Reliability
162
DOI
出版状态已出版 - 11月 2024

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