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Neighborhood repulsed metric learning for kinship verification

  • Jiwen Lu*
  • , Junlin Hu
  • , Xiuzhuang Zhou
  • , Yuanyuan Shang
  • , Yap Peng Tan
  • , Gang Wang
  • *此作品的通讯作者
  • Advanced Digital Sciences Center
  • Beijing Normal University
  • Capital Normal University
  • Nanyang Technological University

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

Kinship verification from facial images is a challenging problem in computer vision, and there is a very few attempts on tackling this problem in the literature. In this paper, we propose a new neighborhood repulsed metric learning (NRML) method for kinship verification. Motivated by the fact that interclass samples (without kinship relations) with higher similarity usually lie in a neighborhood and are more easily misclassified than those with lower similarity, we aim to learn a distance metric under which the intraclass samples (with kinship relations) are pushed as close as possible and interclass samples lying in a neighborhood are repulsed and pulled as far as possible, simultaneously, such that more discriminative information can be exploited for verification. Moreover, we propose a multiview NRM-L (MNRML) method to seek a common distance metric to make better use of multiple feature descriptors to further improve the verification performance. Experimental results are presented to demonstrate the efficacy of the proposed methods.

源语言英语
主期刊名2012 IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2012
2594-2601
页数8
DOI
出版状态已出版 - 2012
已对外发布
活动2012 IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2012 - Providence, RI, 美国
期限: 16 6月 201221 6月 2012

出版系列

姓名Proceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition
ISSN(印刷版)1063-6919

会议

会议2012 IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2012
国家/地区美国
Providence, RI
时期16/06/1221/06/12

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