跳到主要导航 跳到搜索 跳到主要内容

Negative capacitance transistors with monolayer black phosphorus

  • Fei Liu*
  • , Yan Zhou
  • , Yijiao Wang
  • , Xiaoyan Liu
  • , Jian Wang
  • , Hong Guo
  • *此作品的通讯作者
  • The University of Hong Kong
  • McGill University
  • Nanjing University
  • Peking University

科研成果: 期刊稿件文章同行评审

摘要

Quantum transport properties of negative capacitance transistors (NC-FETs) with monolayer black phosphorus (ML-BP) are theoretically studied. Our calculations show that atomistic thin ML-BP can enhance the amplification effect of the ferroelectric layer, and subthreshold swing is effectively reduced to 27 mV per decade in ML-BP NC-FETs. Device performance can be further improved by increasing the thickness of ferroelectric layer and using thinner or high-k insulate layer. Due to the temperature dependence of ferroelectric layer ML-BP NC-FETs have higher on-state current at low temperature, which is different from that of MOSFETs. By considering the metal-ferroelectric interface layer, our calculations show that the device performance is degraded by the interface. Compared with the International Technology Roadmap (ITRS) 2013 requirements, ML-BP NC-FETs can fulfil the ITRS requirements for high-performance logic with a reduced supply voltage. The new device can achieve very low power delay product per device width at VD = 0.3 V, which is just 44% of that in ML-BP FETs.

源语言英语
文章编号16004
期刊npj Quantum Materials
1
DOI
出版状态已出版 - 27 7月 2016
已对外发布

指纹

探究 'Negative capacitance transistors with monolayer black phosphorus' 的科研主题。它们共同构成独一无二的指纹。

引用此