Modeling and analysis of failure mechanism dependence based on petri net

Yingyi Li; Ying Chen; Ning Tang; Liu Yang

doi:10.1109/PHM.2016.7819904

Modeling and analysis of failure mechanism dependence based on petri net

Yingyi Li
, Ying Chen
, Ning Tang
, Liu Yang

Beihang University

科研成果: 书/报告/会议事项章节 › 会议稿件 › 同行评审

4 引用（Scopus）

摘要

Reliability analysis based on failure mechanism takes advantage of unnecessary requirement for the field data, compared with the traditional method based on probability statistics. Current reliability analysis for systems based on failure dependence mainly focus their views on either failure level or failure process level, but barely from the aspect of failure mechanism. Our previous work used Mechanism Failure Tree (MFT) to show the correlation of failure mechanisms directly, but it is unavailable to express the dynamic flow of failure states. This paper proposed a modeling method of dependence of failure mechanism based on Petri net for electronic systems. Compared with MFT, the dynamic characteristics of failure mechanisms can be indicated effectively. In this paper, the models based on Petri net of four basic dependence of failure mechanisms which is utilized to generate the Petri net model of dependence of failure mechanism for a practical system have been given. And a case of a simple electronic system has been studied in the final part in order to illuminate the process of modeling.

源语言	英语
主期刊名	Proceedings of 2016 Prognostics and System Health Management Conference, PHM-Chengdu 2016
编辑	Qiang Miao, Zhaojun Li, Ming J. Zuo, Liudong Xing, Zhigang Tian
出版商	Institute of Electrical and Electronics Engineers Inc.
ISBN（电子版）	9781509027781
DOI	https://doi.org/10.1109/PHM.2016.7819904
出版状态	已出版 - 16 1月 2017
活动	7th IEEE Prognostics and System Health Management Conference, PHM-Chengdu 2016 - Chengdu, Sichuan, 中国期限: 19 10月 2016 → 21 10月 2016

出版系列

姓名	Proceedings of 2016 Prognostics and System Health Management Conference, PHM-Chengdu 2016

会议

会议	7th IEEE Prognostics and System Health Management Conference, PHM-Chengdu 2016
国家/地区	中国
市	Chengdu, Sichuan
时期	19/10/16 → 21/10/16

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10.1109/PHM.2016.7819904

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引用此

Li, Y., Chen, Y., Tang, N., & Yang, L. (2017). Modeling and analysis of failure mechanism dependence based on petri net. 在 Q. Miao, Z. Li, M. J. Zuo, L. Xing, & Z. Tian (编辑), Proceedings of 2016 Prognostics and System Health Management Conference, PHM-Chengdu 2016 文章 7819904 (Proceedings of 2016 Prognostics and System Health Management Conference, PHM-Chengdu 2016). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/PHM.2016.7819904

Li, Yingyi ; Chen, Ying ; Tang, Ning 等. / Modeling and analysis of failure mechanism dependence based on petri net. Proceedings of 2016 Prognostics and System Health Management Conference, PHM-Chengdu 2016. 编辑 / Qiang Miao ; Zhaojun Li ; Ming J. Zuo ; Liudong Xing ; Zhigang Tian. Institute of Electrical and Electronics Engineers Inc., 2017. (Proceedings of 2016 Prognostics and System Health Management Conference, PHM-Chengdu 2016).

@inproceedings{cd3ad915b12649ed901e48ab93926d5f,

title = "Modeling and analysis of failure mechanism dependence based on petri net",

abstract = "Reliability analysis based on failure mechanism takes advantage of unnecessary requirement for the field data, compared with the traditional method based on probability statistics. Current reliability analysis for systems based on failure dependence mainly focus their views on either failure level or failure process level, but barely from the aspect of failure mechanism. Our previous work used Mechanism Failure Tree (MFT) to show the correlation of failure mechanisms directly, but it is unavailable to express the dynamic flow of failure states. This paper proposed a modeling method of dependence of failure mechanism based on Petri net for electronic systems. Compared with MFT, the dynamic characteristics of failure mechanisms can be indicated effectively. In this paper, the models based on Petri net of four basic dependence of failure mechanisms which is utilized to generate the Petri net model of dependence of failure mechanism for a practical system have been given. And a case of a simple electronic system has been studied in the final part in order to illuminate the process of modeling.",

keywords = "Dependence of failure mechanism, Electronic systems, Petri net, Reliability analysis",

author = "Yingyi Li and Ying Chen and Ning Tang and Liu Yang",

note = "Publisher Copyright: {\textcopyright} 2016 IEEE.; 7th IEEE Prognostics and System Health Management Conference, PHM-Chengdu 2016 ; Conference date: 19-10-2016 Through 21-10-2016",

year = "2017",

month = jan,

day = "16",

doi = "10.1109/PHM.2016.7819904",

language = "英语",

series = "Proceedings of 2016 Prognostics and System Health Management Conference, PHM-Chengdu 2016",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

editor = "Qiang Miao and Zhaojun Li and Zuo, \{Ming J.\} and Liudong Xing and Zhigang Tian",

booktitle = "Proceedings of 2016 Prognostics and System Health Management Conference, PHM-Chengdu 2016",

address = "美国",

}

Li, Y , Chen, Y, Tang, N & Yang, L 2017, Modeling and analysis of failure mechanism dependence based on petri net. 在 Q Miao, Z Li, MJ Zuo, L Xing & Z Tian (编辑), Proceedings of 2016 Prognostics and System Health Management Conference, PHM-Chengdu 2016., 7819904, Proceedings of 2016 Prognostics and System Health Management Conference, PHM-Chengdu 2016, Institute of Electrical and Electronics Engineers Inc., 7th IEEE Prognostics and System Health Management Conference, PHM-Chengdu 2016, Chengdu, Sichuan, 中国, 19/10/16. https://doi.org/10.1109/PHM.2016.7819904

Modeling and analysis of failure mechanism dependence based on petri net. / Li, Yingyi ; Chen, Ying; Tang, Ning 等.
Proceedings of 2016 Prognostics and System Health Management Conference, PHM-Chengdu 2016. 编辑 / Qiang Miao; Zhaojun Li; Ming J. Zuo; Liudong Xing; Zhigang Tian. Institute of Electrical and Electronics Engineers Inc., 2017. 7819904 (Proceedings of 2016 Prognostics and System Health Management Conference, PHM-Chengdu 2016).

科研成果: 书/报告/会议事项章节 › 会议稿件 › 同行评审

TY - GEN

T1 - Modeling and analysis of failure mechanism dependence based on petri net

AU - Li, Yingyi

AU - Chen, Ying

AU - Tang, Ning

AU - Yang, Liu

PY - 2017/1/16

Y1 - 2017/1/16

N2 - Reliability analysis based on failure mechanism takes advantage of unnecessary requirement for the field data, compared with the traditional method based on probability statistics. Current reliability analysis for systems based on failure dependence mainly focus their views on either failure level or failure process level, but barely from the aspect of failure mechanism. Our previous work used Mechanism Failure Tree (MFT) to show the correlation of failure mechanisms directly, but it is unavailable to express the dynamic flow of failure states. This paper proposed a modeling method of dependence of failure mechanism based on Petri net for electronic systems. Compared with MFT, the dynamic characteristics of failure mechanisms can be indicated effectively. In this paper, the models based on Petri net of four basic dependence of failure mechanisms which is utilized to generate the Petri net model of dependence of failure mechanism for a practical system have been given. And a case of a simple electronic system has been studied in the final part in order to illuminate the process of modeling.

AB - Reliability analysis based on failure mechanism takes advantage of unnecessary requirement for the field data, compared with the traditional method based on probability statistics. Current reliability analysis for systems based on failure dependence mainly focus their views on either failure level or failure process level, but barely from the aspect of failure mechanism. Our previous work used Mechanism Failure Tree (MFT) to show the correlation of failure mechanisms directly, but it is unavailable to express the dynamic flow of failure states. This paper proposed a modeling method of dependence of failure mechanism based on Petri net for electronic systems. Compared with MFT, the dynamic characteristics of failure mechanisms can be indicated effectively. In this paper, the models based on Petri net of four basic dependence of failure mechanisms which is utilized to generate the Petri net model of dependence of failure mechanism for a practical system have been given. And a case of a simple electronic system has been studied in the final part in order to illuminate the process of modeling.

KW - Dependence of failure mechanism

KW - Electronic systems

KW - Petri net

KW - Reliability analysis

UR - https://www.scopus.com/pages/publications/85015669075

U2 - 10.1109/PHM.2016.7819904

DO - 10.1109/PHM.2016.7819904

M3 - 会议稿件

AN - SCOPUS:85015669075

T3 - Proceedings of 2016 Prognostics and System Health Management Conference, PHM-Chengdu 2016

BT - Proceedings of 2016 Prognostics and System Health Management Conference, PHM-Chengdu 2016

A2 - Miao, Qiang

A2 - Li, Zhaojun

A2 - Zuo, Ming J.

A2 - Xing, Liudong

A2 - Tian, Zhigang

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 7th IEEE Prognostics and System Health Management Conference, PHM-Chengdu 2016

Y2 - 19 October 2016 through 21 October 2016

ER -

Li Y , Chen Y, Tang N, Yang L. Modeling and analysis of failure mechanism dependence based on petri net. 在 Miao Q, Li Z, Zuo MJ, Xing L, Tian Z, 编辑, Proceedings of 2016 Prognostics and System Health Management Conference, PHM-Chengdu 2016. Institute of Electrical and Electronics Engineers Inc. 2017. 7819904. (Proceedings of 2016 Prognostics and System Health Management Conference, PHM-Chengdu 2016). doi: 10.1109/PHM.2016.7819904

Modeling and analysis of failure mechanism dependence based on petri net

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