TY - JOUR
T1 - Method for reliability parameter calculation of electronic products based on physics of failure models
AU - Luo, Ming Zhu
AU - Chen, Ying
AU - Kang, Rui
PY - 2014/4
Y1 - 2014/4
N2 - The existing reliability prediction methods based on physics of failure (PoF) models merely calculate electronic products' time to failure responding to a single typical mission profile. A novel reliability parameter calculation method based on PoF models and Monte Carlo simulation is presented, which can quantitatively analyze the reliability of electronic products actually undergoing multiple mission profiles in the whole life cycle. The method is applied to some airborne electronic equipment to calculate the mean time to failure (MTTF) and build time functions of failure rate and reliability. The results are contrastively analyzed with those concluded by the empirical model based method and reliability enhancement testing. It shows that the proposed method can not only calculate reliability parameters but also find out design weaknesses and their quantitative relationships with reliability parameters, which is an effective guidance to design improvements.
AB - The existing reliability prediction methods based on physics of failure (PoF) models merely calculate electronic products' time to failure responding to a single typical mission profile. A novel reliability parameter calculation method based on PoF models and Monte Carlo simulation is presented, which can quantitatively analyze the reliability of electronic products actually undergoing multiple mission profiles in the whole life cycle. The method is applied to some airborne electronic equipment to calculate the mean time to failure (MTTF) and build time functions of failure rate and reliability. The results are contrastively analyzed with those concluded by the empirical model based method and reliability enhancement testing. It shows that the proposed method can not only calculate reliability parameters but also find out design weaknesses and their quantitative relationships with reliability parameters, which is an effective guidance to design improvements.
KW - Failure distribution
KW - Monte Carlo simulation
KW - Multiple mission profile
KW - Parameter calculation
KW - Physics of failure (PoF) model
KW - Reliability
UR - https://www.scopus.com/pages/publications/84900474842
U2 - 10.3969/j.issn.1001-506X.2014.04.31
DO - 10.3969/j.issn.1001-506X.2014.04.31
M3 - 文章
AN - SCOPUS:84900474842
SN - 1001-506X
VL - 36
SP - 795
EP - 801
JO - Xi Tong Gong Cheng Yu Dian Zi Ji Shu/Systems Engineering and Electronics
JF - Xi Tong Gong Cheng Yu Dian Zi Ji Shu/Systems Engineering and Electronics
IS - 4
ER -