Method for fault characterization parameters calculation of electronic products based on physics failure and reliability sensitivity analysis

Yang Liu; Yufeng Sun; Weiwei Hu; Yaqiu Li

Method for fault characterization parameters calculation of electronic products based on physics failure and reliability sensitivity analysis

Yang Liu
, Yufeng Sun
, Weiwei Hu
, Yaqiu Li

可靠性与系统工程学院

Beihang University

科研成果: 会议稿件 › 论文 › 同行评审

源语言	英语
出版状态	已出版 - 2016
活动	Joint Conference on Machinery Failure Prevention Technology Conference, MFPT 2016 and ISA's 62nd International Instrumentation Symposium, IIS 2016 - Dayton, 美国期限: 24 5月 2016 → 26 5月 2016

会议

会议	Joint Conference on Machinery Failure Prevention Technology Conference, MFPT 2016 and ISA's 62nd International Instrumentation Symposium, IIS 2016
国家/地区	美国
市	Dayton
时期	24/05/16 → 26/05/16

其它文件与链接

链接到 Scopus 的出版物

引用此

@conference{1bccbd6c70bf4fccb26bdfa62f9181f0,

title = "Method for fault characterization parameters calculation of electronic products based on physics failure and reliability sensitivity analysis",

author = "Yang Liu and Yufeng Sun and Weiwei Hu and Yaqiu Li",

year = "2016",

language = "英语",

note = "Joint Conference on Machinery Failure Prevention Technology Conference, MFPT 2016 and ISA's 62nd International Instrumentation Symposium, IIS 2016 ; Conference date: 24-05-2016 Through 26-05-2016",

}

Liu, Y, Sun, Y , Hu, W & Li, Y 2016, 'Method for fault characterization parameters calculation of electronic products based on physics failure and reliability sensitivity analysis', 论文发表于 Joint Conference on Machinery Failure Prevention Technology Conference, MFPT 2016 and ISA's 62nd International Instrumentation Symposium, IIS 2016, Dayton, 美国, 24/05/16 - 26/05/16.

Method for fault characterization parameters calculation of electronic products based on physics failure and reliability sensitivity analysis. / Liu, Yang; Sun, Yufeng ; Hu, Weiwei 等.
2016. 论文发表于 Joint Conference on Machinery Failure Prevention Technology Conference, MFPT 2016 and ISA's 62nd International Instrumentation Symposium, IIS 2016, Dayton, 美国.

科研成果: 会议稿件 › 论文 › 同行评审

TY - CONF

T1 - Method for fault characterization parameters calculation of electronic products based on physics failure and reliability sensitivity analysis

AU - Liu, Yang

AU - Sun, Yufeng

AU - Hu, Weiwei

AU - Li, Yaqiu

PY - 2016

Y1 - 2016

UR - https://www.scopus.com/pages/publications/84979503812

M3 - 论文

AN - SCOPUS:84979503812

T2 - Joint Conference on Machinery Failure Prevention Technology Conference, MFPT 2016 and ISA's 62nd International Instrumentation Symposium, IIS 2016

Y2 - 24 May 2016 through 26 May 2016

ER -