跳到主要导航 跳到搜索 跳到主要内容

Medical software bug prediction based on static analysis

  • Beihang University

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

Monitoring and predicting the increasing or decreasing trend of bug number in a software is of great importance to both software developers and users. Accurate predicting of number of software bug will help developers make timely and correct decision. For software users, knowing the possible number of software bugs will enable them to take seasonable actions to cope with loss caused by possible software bugs. Medical software is vital to people's health, and therefore, the bug prediction of medical software is more important and essential than the ordinary software. To accomplish this goal, we present a method based on static analysis and correlation analysis to predict the bug number of medical image informatics software 3D Slicer and ITK. We obtain the complexity metrics through static analysis, then get the bug predicted value via correlation analysis between existing bug number and complexity metrics. The core idea of this paper is that the changes of software complexity metrics obtained by static analysis can reflect the changes of the bug number, and the predicted results prove the feasibility of this method. In addition, the method proposed in this paper is also applicable to other types of software other than medical software.

源语言英语
主期刊名Proceedings IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society
出版商Institute of Electrical and Electronics Engineers Inc.
5460-5464
页数5
ISBN(电子版)9781538611272
DOI
出版状态已出版 - 15 12月 2017
活动43rd Annual Conference of the IEEE Industrial Electronics Society, IECON 2017 - Beijing, 中国
期限: 29 10月 20171 11月 2017

出版系列

姓名Proceedings IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society
2017-January

会议

会议43rd Annual Conference of the IEEE Industrial Electronics Society, IECON 2017
国家/地区中国
Beijing
时期29/10/171/11/17

指纹

探究 'Medical software bug prediction based on static analysis' 的科研主题。它们共同构成独一无二的指纹。

引用此