摘要
In this paper, by a group of electric-thermal cycle tests of NPN type switch transistors, the aluminum corrosion mechanism is demonstrated. And it was found that aluminum metal of chip surface was severely corroded under the high vapor and high electric field environment. It was analyzed that the electric field can accelerate aluminum corrosion. Under the electric filed, the main products of Al(OH)3 hydrolyzation are negative state ions such AlCl4 -, AlO2 - and so on. The electric potential difference conduce the movement, emigration and distribution of aluminum corrosion resultants from low electric potential site (base board edge) to high electric potential site (equipotential rings).
| 源语言 | 英语 |
|---|---|
| 页(从-至) | 214-221 |
| 页数 | 8 |
| 期刊 | International Journal of Advancements in Computing Technology |
| 卷 | 4 |
| 期 | 20 |
| DOI | |
| 出版状态 | 已出版 - 11月 2012 |
联合国可持续发展目标
此成果有助于实现下列可持续发展目标:
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可持续发展目标 10 减少不平等
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