TY - JOUR
T1 - Mechanism analysis of aluminum corrosion and its application to switch transistor
AU - Huang, Jiaoying
AU - Gao, Cheng
AU - Chen, Jinyan
AU - Sun, Yue
PY - 2012/11
Y1 - 2012/11
N2 - In this paper, aluminum corrosion mechanism in switch transistor was analyzed. And a group of NPN type switch transistors contrast electric-thermal cycle tests of whether it is vapor control, passivation protection, equipotential rings exist, and clearance enhancement before package were carried out, respectively. By contrast tests, the aluminum corrosion mechanisms are analyzed. Effects of temperature, moisture (vapor), voltage (electric field) and ion contamination on aluminum corrosion occurrence and degree and speed are analyzed too. As well as the aluminum corrosion configurations, distributions, and related factors are analyzed. Finally, the best measure to control aluminum corrosion through control interior vapor to insulate the necessary condition of corrosion occurrence was recommended.
AB - In this paper, aluminum corrosion mechanism in switch transistor was analyzed. And a group of NPN type switch transistors contrast electric-thermal cycle tests of whether it is vapor control, passivation protection, equipotential rings exist, and clearance enhancement before package were carried out, respectively. By contrast tests, the aluminum corrosion mechanisms are analyzed. Effects of temperature, moisture (vapor), voltage (electric field) and ion contamination on aluminum corrosion occurrence and degree and speed are analyzed too. As well as the aluminum corrosion configurations, distributions, and related factors are analyzed. Finally, the best measure to control aluminum corrosion through control interior vapor to insulate the necessary condition of corrosion occurrence was recommended.
KW - Aluminum corrosion
KW - Contamination
KW - Deposition
KW - Passivation defect
KW - Vapor
UR - https://www.scopus.com/pages/publications/84869235685
U2 - 10.4156/ijact.vol4.issue20.27
DO - 10.4156/ijact.vol4.issue20.27
M3 - 文章
AN - SCOPUS:84869235685
SN - 2005-8039
VL - 4
SP - 222
EP - 229
JO - International Journal of Advancements in Computing Technology
JF - International Journal of Advancements in Computing Technology
IS - 20
ER -