Measurement uncertainties of conducted emission

Xiao Wen Xu; Dong Lin Su; Jun Feng Guo; Zhi Hang Liu

Measurement uncertainties of conducted emission

Xiao Wen Xu^*
, Dong Lin Su
, Jun Feng Guo
, Zhi Hang Liu

^*此作品的通讯作者

电子信息工程学院

Beihang University
CAST

科研成果: 期刊稿件 › 文章 › 同行评审

摘要

Based on the conducted emission measurements for the power line, the measurement uncertainties which affect the Electro Magnetic Compatibility (EMC) test are analyzed. This paper investigates the type A and type B uncertainties and the systemic errors. The results show that the tiny difference of the test setup can bring much difference.

源语言	英语
页（从-至）	1963-1966
页数	4
期刊	Dianzi Yu Xinxi Xuebao/Journal of Electronics and Information Technology
卷	28
期	10
出版状态	已出版 - 10月 2006

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@article{c59e39a5424b42ed867464c829c2d39b,

title = "Measurement uncertainties of conducted emission",

abstract = "Based on the conducted emission measurements for the power line, the measurement uncertainties which affect the Electro Magnetic Compatibility (EMC) test are analyzed. This paper investigates the type A and type B uncertainties and the systemic errors. The results show that the tiny difference of the test setup can bring much difference.",

keywords = "Conducted emission measurement, EMC, Uncertainty",

author = "Xu, \{Xiao Wen\} and Su, \{Dong Lin\} and Guo, \{Jun Feng\} and Liu, \{Zhi Hang\}",

year = "2006",

month = oct,

language = "英语",

volume = "28",

pages = "1963--1966",

journal = "Dianzi Yu Xinxi Xuebao/Journal of Electronics and Information Technology",

issn = "1009-5896",

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TY - JOUR

T1 - Measurement uncertainties of conducted emission

AU - Xu, Xiao Wen

AU - Su, Dong Lin

AU - Guo, Jun Feng

AU - Liu, Zhi Hang

PY - 2006/10

Y1 - 2006/10

N2 - Based on the conducted emission measurements for the power line, the measurement uncertainties which affect the Electro Magnetic Compatibility (EMC) test are analyzed. This paper investigates the type A and type B uncertainties and the systemic errors. The results show that the tiny difference of the test setup can bring much difference.

AB - Based on the conducted emission measurements for the power line, the measurement uncertainties which affect the Electro Magnetic Compatibility (EMC) test are analyzed. This paper investigates the type A and type B uncertainties and the systemic errors. The results show that the tiny difference of the test setup can bring much difference.

KW - Conducted emission measurement

KW - EMC

KW - Uncertainty

UR - https://www.scopus.com/pages/publications/33751583629

M3 - 文章

AN - SCOPUS:33751583629

SN - 1009-5896

VL - 28

SP - 1963

EP - 1966

JO - Dianzi Yu Xinxi Xuebao/Journal of Electronics and Information Technology

JF - Dianzi Yu Xinxi Xuebao/Journal of Electronics and Information Technology

IS - 10

ER -

Measurement uncertainties of conducted emission

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