Light-induced instability in current conduction of aluminum nitride thin films embedded with Al nanocrystals

Z. Liu; T. P. Chen; Y. Liu; L. Ding; M. Yang; J. I. Wong; Z. H. Cen; Y. B. Li; S. Zhang; S. Fung

doi:10.1063/1.2828691

Light-induced instability in current conduction of aluminum nitride thin films embedded with Al nanocrystals

Z. Liu^*
, T. P. Chen
, Y. Liu
, L. Ding
, M. Yang
, J. I. Wong
, Z. H. Cen
, Y. B. Li
, S. Zhang
, S. Fung

^*此作品的通讯作者

Nanyang Technological University
The University of Hong Kong

科研成果: 期刊稿件 › 文章 › 同行评审

6 引用（Scopus）

摘要

Al nanocrystals (nc-Al) embedded in AlN thin films have been synthesized by rf magnetron sputtering. The influence of ultraviolet (UV) illumination on electrical characteristics of the nc- AlAlN thin film system has been investigated. It is shown that the UV illumination could lead to a random change in the conductance of the thin film system. The change in the conductance is attributed to the charge trapping and detrapping in the nc-Al due to the UV illumination.

源语言	英语
期刊论文编号	013102
期刊	Applied Physics Letters
卷	92
期	1
DOI	https://doi.org/10.1063/1.2828691
出版状态	已出版 - 2008
已对外发布	是

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title = "Light-induced instability in current conduction of aluminum nitride thin films embedded with Al nanocrystals",

abstract = "Al nanocrystals (nc-Al) embedded in AlN thin films have been synthesized by rf magnetron sputtering. The influence of ultraviolet (UV) illumination on electrical characteristics of the nc- AlAlN thin film system has been investigated. It is shown that the UV illumination could lead to a random change in the conductance of the thin film system. The change in the conductance is attributed to the charge trapping and detrapping in the nc-Al due to the UV illumination.",

author = "Z. Liu and Chen, \{T. P.\} and Y. Liu and L. Ding and M. Yang and Wong, \{J. I.\} and Cen, \{Z. H.\} and Li, \{Y. B.\} and S. Zhang and S. Fung",

year = "2008",

doi = "10.1063/1.2828691",

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T1 - Light-induced instability in current conduction of aluminum nitride thin films embedded with Al nanocrystals

AU - Liu, Z.

AU - Chen, T. P.

AU - Liu, Y.

AU - Ding, L.

AU - Yang, M.

AU - Wong, J. I.

AU - Cen, Z. H.

AU - Li, Y. B.

AU - Zhang, S.

AU - Fung, S.

PY - 2008

Y1 - 2008

N2 - Al nanocrystals (nc-Al) embedded in AlN thin films have been synthesized by rf magnetron sputtering. The influence of ultraviolet (UV) illumination on electrical characteristics of the nc- AlAlN thin film system has been investigated. It is shown that the UV illumination could lead to a random change in the conductance of the thin film system. The change in the conductance is attributed to the charge trapping and detrapping in the nc-Al due to the UV illumination.

AB - Al nanocrystals (nc-Al) embedded in AlN thin films have been synthesized by rf magnetron sputtering. The influence of ultraviolet (UV) illumination on electrical characteristics of the nc- AlAlN thin film system has been investigated. It is shown that the UV illumination could lead to a random change in the conductance of the thin film system. The change in the conductance is attributed to the charge trapping and detrapping in the nc-Al due to the UV illumination.

UR - https://www.scopus.com/pages/publications/38049010867

U2 - 10.1063/1.2828691

DO - 10.1063/1.2828691

M3 - 文章

AN - SCOPUS:38049010867

SN - 0003-6951

VL - 92

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 1

M1 - 013102

ER -

Light-induced instability in current conduction of aluminum nitride thin films embedded with Al nanocrystals

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