TY - GEN
T1 - Life prediction of multiple performance parameters ADT based on multidimensional time series analysis
AU - Wang, Li
AU - Liu, Zaiwen
AU - Wan, Bo
AU - Zhao, Youhu
PY - 2013
Y1 - 2013
N2 - For long lifetime and high reliability products, it is difficult to obtain failure data in a short time period. Hence, Accelerated Degradation Testing (ADT) is presented to deal with the cases where no failure time data could be obtained but degradation data of parameters of the product are available. At present, the ADT life prediction method is utilized primarily with feedback from a single performance parameter ADT dataset. However, for most products, multiple performance parameters of these products will degrade with time, leading to failure. It is important to note that often the products various performance parameters will interact with each other as the performance degrades. Hence, a correct life prediction based on ADT data must take into account the integrated effect of a product's multiple performance parameters and the random effect of environmental variables.
AB - For long lifetime and high reliability products, it is difficult to obtain failure data in a short time period. Hence, Accelerated Degradation Testing (ADT) is presented to deal with the cases where no failure time data could be obtained but degradation data of parameters of the product are available. At present, the ADT life prediction method is utilized primarily with feedback from a single performance parameter ADT dataset. However, for most products, multiple performance parameters of these products will degrade with time, leading to failure. It is important to note that often the products various performance parameters will interact with each other as the performance degrades. Hence, a correct life prediction based on ADT data must take into account the integrated effect of a product's multiple performance parameters and the random effect of environmental variables.
KW - ADT
KW - Life Prediction
KW - Multidimensional Time Series
KW - Multiple Performance Parameters
UR - https://www.scopus.com/pages/publications/84879357354
U2 - 10.1109/RAMS.2013.6517670
DO - 10.1109/RAMS.2013.6517670
M3 - 会议稿件
AN - SCOPUS:84879357354
SN - 9781467347099
T3 - Proceedings - Annual Reliability and Maintainability Symposium
BT - 59th Annual Reliability and Maintainability Symposium, RAMS 2013 - Proceedings and Tutorials
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 59th Annual Reliability and Maintainability Symposium, RAMS 2013
Y2 - 28 January 2013 through 31 January 2013
ER -