Investigation of the Influence of the Interference Waveforms, Port Types, and Temperature Variations on the Electromagnetic Susceptibility of Differential Driver Chips in Sensing Systems

Differential driver chips enhance the signal quality and transmission efficiency in sensor systems, especially under challenging electromagnetic environments. This article posits that different waveform interference signals, different disturbed ports, and different temperatures may compromise the electromagnetic susceptibility (EMS) of these chips, leading to phenomena such as latch-up, which results in abnormal volt current condenser (VCC) port currents and potential damage to the device. To validate this hypothesis, we proposed an innovative EMS testing method that utilizes signal characteristic sets to evaluate the effects of varying external temperatures, interference waveforms, and disturbed port conditions on the chip's functionality. Our systematic experimentation reveals that external temperature variations exert a negligible influence on the EMS of these chips. In contrast, different interference signals and disturbed ports have a pronounced impact, significantly exacerbating the risk of abnormal currents. The results confirm our proposed hypothesis. This study lays the foundation for further optimization of the design of the differential driver and helps to improve the electromagnetic immunity performance of this type of device in the future.