摘要
Atomic defects exist in various heterojunctions and can remarkably affect their properties, yet it remains a challenging task to identify each individual defect. Here, by combining advanced transmission electron microscopy, spectroscopy and first-principles calculations, we obtain a structural and element-selective imaging of defects at an interface between MgO and SrTiO3. We demonstrate that even for structurally simple MgO and SrTiO3, their interface involves a defect complex comprising of substitutional Ti and Mg vacancies, which induce a marked shift in electronic states. The Ti atoms diffused into MgO exhibit a valence state of +4 and a certain degree of covalency to the surrounding oxygen. Such an ability to determine defects allows us to precisely alter heterojunctions so as to critically improve the device performances.
| 源语言 | 英语 |
|---|---|
| 页(从-至) | 51002-51007 |
| 页数 | 6 |
| 期刊 | RSC Advances |
| 卷 | 4 |
| 期 | 92 |
| DOI | |
| 出版状态 | 已出版 - 2014 |
| 已对外发布 | 是 |
指纹
探究 'Interfacial defect complex at the MgO/SrTiO3 heterojunction and its electronic impact' 的科研主题。它们共同构成独一无二的指纹。引用此
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