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Integrated state test system of high voltage circuit breakers based on embedded technology

  • Yang Fan*
  • , Qiao Chenxi
  • , Zhang Xiaohui
  • , Dong Jun
  • , Pei Yujie
  • , Hu Xiaoguang
  • *此作品的通讯作者
  • Beihang University

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

It is especially necessary to monitor the operation state of high voltage circuit breakers to ensure the smooth and safe running of power system. This paper presents the construction and principle of a designed system for diagnostic testing of high voltage circuit breakers. The test system is based on the architecture of ARM as processor and embedded LINUX as operating system. Modular design of the hardware platform is proposed. And the hardware platform consists of ARM core board, signal collection module, A/D sample module and result display module. To develop applications, the ARM is transplanted with Qt/Embedded. And the discrete-time Mallet wavelet transform algorithm is used to process coil current signal. This test system has the feature of high reliability, flexible configuration and many characteristic parameters of high voltage circuit breakers can be obtained through it.

源语言英语
主期刊名Proceedings of the 2011 6th IEEE Conference on Industrial Electronics and Applications, ICIEA 2011
1605-1609
页数5
DOI
出版状态已出版 - 2011
活动2011 6th IEEE Conference on Industrial Electronics and Applications, ICIEA 2011 - Beijing, 中国
期限: 21 6月 201123 6月 2011

出版系列

姓名Proceedings of the 2011 6th IEEE Conference on Industrial Electronics and Applications, ICIEA 2011

会议

会议2011 6th IEEE Conference on Industrial Electronics and Applications, ICIEA 2011
国家/地区中国
Beijing
时期21/06/1123/06/11

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