@inproceedings{cf90425121364818a1925180f3c53f92,
title = "Influence of working distance on microscale strain measurement under laser scanning microscope from moir{\'e} fringes",
abstract = "In this study, the influence of the working distance (WD) on strain measurement under a laser scanning microscope and a way to achieve precise focus were investigated by the scanning moir{\'e} method. Experimental results showed that the strain measurement has a good repeatability at a fixed WD. Scanning moir{\'e} fringes were clearly observable when the WD variation range was within 0.9\% of the given WD of the used objective lens. The relationship of the measured strain error and the WD difference was approximately linear, and the greatest strain error was near 700 μ{\^I}μ . Fortunately, 2D moir{\'e} fringes were distinct only in a very narrow range, i.e., the WD difference was less than 0.1\% of the given WD, and the greatest strain error was less than 100 μ{\^I}μ . 1D moir{\'e} fringes in the y direction, 2D moir{\'e} fringes in the both x and y directions, and 1D moir{\'e} fringes in the x direction became distinct alternately along with the WD change. Consequently, we suggest to use 2D moir{\'e} fringes for microscale strain measurement in each focusing process to reduce the errors caused by the WD variation. Moreover, a single-shot 2D moir{\'e} image is useful to measure the strain distributions in both two directions quickly and simply, and there is no need to rotate the sample or scanning lines and scan twice as in the conventional way.",
keywords = "2D moir{\'e}, Laser microscope, Microscale deformation, Strain measurement, Working distance",
author = "Qinghua Wang and Yosuke Takashita and Shien Ri and Hiroshi Tsuda and Ryuta Kitamura and Shinji Ogihara",
note = "Publisher Copyright: {\textcopyright} 2017 COPYRIGHT SPIE.; International Conference on Optical and Photonics Engineering, icOPEN 2016 ; Conference date: 26-09-2016 Through 30-09-2016",
year = "2017",
doi = "10.1117/12.2266697",
language = "英语",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
publisher = "SPIE",
editor = "Asundi, \{Anand Krishna\}",
booktitle = "International Conference on Optical and Photonics Engineering, icOPEN 2016",
address = "美国",
}