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Influence of oxygen partial pressure on magnetron sputtered Sr0.8Nd0.3Bi2.5Ta2O9+x ferroelectric thin films

  • Yibin Li
  • , Sam Zhang*
  • , Thirumany Sritharan
  • , Yang Liu
  • , T. P. Chen
  • *此作品的通讯作者
  • Nanyang Technological University

科研成果: 期刊稿件文章同行评审

摘要

During magnetron sputtering deposition of SrBi2Ta2O9 thin films, oxygen gas is introduced in the deposition chamber to compensate the oxygen loss during sputtering. In this paper, the influence of oxygen partial pressure is systematically investigated in sputtering of Sr0.8Nd0.3Bi2.5Ta2O9+x thin films, using X-ray diffraction, X-ray photoelectron spectroscopy and field emission scanning electron microscopy. The studies confirm that at various oxygen partial pressure Nd3+ ions substitute into the bismuth layered perovskite structure, preferentially at the Sr2+ site. The deposition rate, composition, microstructure and polarization properties of the films highly depend on the oxygen partial pressure.

源语言英语
页(从-至)549-554
页数6
期刊Journal of Alloys and Compounds
457
1-2
DOI
出版状态已出版 - 12 6月 2008
已对外发布

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