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In-situ measurement of residual magnetic field in SERF atomic magnetometer based on transient response

  • Di Zhan
  • , Yaoguo Wang
  • , Jixi Lu*
  • *此作品的通讯作者
  • Beihang University
  • Hefei National Laboratory

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

Maintaining a near-zero magnetic field condition is a requisite for atomic magnetometer under the spin-exchange relaxation-free (SERF) regime. Therefore, the precise determination of the residual magnetic fields is of great significance. Herein, we proposed an in-situ measurement method of residual magnetic fields in a dual-beam atomic magnetometer based on a transient response of the transverse polarization along the probe beam direction after switching off the pump beam. Proceeding from the Bloch equation, we established a complete evolution expression of the polarization vector under any static residual magnetic field with the pump beam switched off. On this basis, we analyzed the transient response of the transverse polarization by numerical simulation under different situations of residual magnetic fields. Besides, we also considered two possible conditions when the residual magnetic fields are relatively large or small, respectively. Accordingly, we presented an efficient and convenient estimation method of the residual magnetic fields based on certain time characteristics of the transient response. We verified the feasibility of our method by experiment and achieved a triaxial residual magnetic fields measurement within 0.5 s. This method can realize an insitu and real-time measurement of the residual magnetic fields in a fast and convenient way. Furthermore, this method can evaluate the effectiveness of different magnetic field compensation methods without introducing any modulation or extra devices.

源语言英语
主期刊名Advanced Sensor Systems and Applications XIV
编辑Minghong Yang, Chang-Seok Kim, Xinyu Fan, Jianzhong Zhang
出版商SPIE
ISBN(电子版)9781510682146
DOI
出版状态已出版 - 2024
活动Advanced Sensor Systems and Applications XIV 2024 - Nantong, 中国
期限: 13 10月 202415 10月 2024

出版系列

姓名Proceedings of SPIE - The International Society for Optical Engineering
13243
ISSN(印刷版)0277-786X
ISSN(电子版)1996-756X

会议

会议Advanced Sensor Systems and Applications XIV 2024
国家/地区中国
Nantong
时期13/10/2415/10/24

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