TY - GEN
T1 - High brightness plasma source sustained by pulse laser
AU - Yang, Shichao
AU - Shi, Zhaojiang
AU - Hu, He
AU - Yu, Xia
N1 - Publisher Copyright:
© 2024 SPIE.
PY - 2024
Y1 - 2024
N2 - Laser-sustained plasma (LSP) source featured by high brightness and wide spectral range is found to be powerful in advanced inspection and spectroscopy applications. Brightness is the key indicator that determines the speed of semiconductor defect inspection. However, the spatial asymmetry of the laser power absorbed by the plasma drives it to grow in the direction of laser incidence, resulting in a decrease in plasma temperature, hence restricting the improvement of brightness. In this paper, we propose an innovative pulse laser-sustained plasma to break through the plasma temperature limitation. Driven by the elevated plasma temperature, the plasma emission power is significantly enhanced. We establish a two-dimensional transient fluid model for LSP to quantitatively construct the relationship between plasma temperature and laser characteristics. The evolution process of LSP is studied systematically through this model. For the first time, we report an important conceptual advance that the use of pulse laser suppresses the defocus displacement of the plasma, thus increasing the plasma temperature conspicuously. Experimental results demonstrate that the plasma emission is enhanced through the entire wavelength range and time period, compared with continuous laser with the same average power. Especially in the ultraviolet band (<400 nm), the enhancement of plasma emission exceeds 50%. This paper establishes a quantitative relationship between laser temporal characteristics and the spatial distribution of plasma temperature, providing theoretical support and experimental verification for achieving high brightness plasma light sources through laser temporal modulation.
AB - Laser-sustained plasma (LSP) source featured by high brightness and wide spectral range is found to be powerful in advanced inspection and spectroscopy applications. Brightness is the key indicator that determines the speed of semiconductor defect inspection. However, the spatial asymmetry of the laser power absorbed by the plasma drives it to grow in the direction of laser incidence, resulting in a decrease in plasma temperature, hence restricting the improvement of brightness. In this paper, we propose an innovative pulse laser-sustained plasma to break through the plasma temperature limitation. Driven by the elevated plasma temperature, the plasma emission power is significantly enhanced. We establish a two-dimensional transient fluid model for LSP to quantitatively construct the relationship between plasma temperature and laser characteristics. The evolution process of LSP is studied systematically through this model. For the first time, we report an important conceptual advance that the use of pulse laser suppresses the defocus displacement of the plasma, thus increasing the plasma temperature conspicuously. Experimental results demonstrate that the plasma emission is enhanced through the entire wavelength range and time period, compared with continuous laser with the same average power. Especially in the ultraviolet band (<400 nm), the enhancement of plasma emission exceeds 50%. This paper establishes a quantitative relationship between laser temporal characteristics and the spatial distribution of plasma temperature, providing theoretical support and experimental verification for achieving high brightness plasma light sources through laser temporal modulation.
KW - fiber laser
KW - high brightness source
KW - laser-sustained plasma
KW - plasma technology
UR - https://www.scopus.com/pages/publications/85207497265
U2 - 10.1117/12.3038914
DO - 10.1117/12.3038914
M3 - 会议稿件
AN - SCOPUS:85207497265
T3 - Proceedings of SPIE - The International Society for Optical Engineering
BT - Nineteenth National Conference on Laser Technology and Optoelectronics
A2 - Liu, Qiang
PB - SPIE
T2 - 19th National Conference on Laser Technology and Optoelectronics
Y2 - 21 June 2024 through 24 June 2024
ER -