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Hard-Switching Loss Calculation Model For Fast-Switching GaN HEMT in Half-Bridge Circuit

  • Beihang University

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

In power conversion applications using GaN HEMT with high switching frequency, switching loss dominates in total power loss and could be very sensitive to parasitic parameters as a result of fast-switching operation. Since conventional switching loss calculation formula suffers from inconsistent error in designs with GaN HEMTs and various conditions, it is desirable to have effective ways for more accurate estimation on switching loss of GaN HEMT. In this paper, two different kinds of switching loss calculation model are developed in forms of both empirical formula and analytical model, taking into account the effect of critical parasitic inductances and junction temperature. The comparison results of two calculation methods with traditional calculation method are presented for the effectiveness of models. Moreover, the effect of nonideal parameters, such as power loop parasitic inductance, common-source inductance and junction temperature are evaluated.

源语言英语
主期刊名IECON 2023 - 49th Annual Conference of the IEEE Industrial Electronics Society
出版商IEEE Computer Society
ISBN(电子版)9798350331820
DOI
出版状态已出版 - 2023
活动49th Annual Conference of the IEEE Industrial Electronics Society, IECON 2023 - Singapore, 新加坡
期限: 16 10月 202319 10月 2023

出版系列

姓名IECON Proceedings (Industrial Electronics Conference)
ISSN(印刷版)2162-4704
ISSN(电子版)2577-1647

会议

会议49th Annual Conference of the IEEE Industrial Electronics Society, IECON 2023
国家/地区新加坡
Singapore
时期16/10/2319/10/23

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