TY - JOUR
T1 - Graphite Carbon-Doped Sb2Te Nanostructures for Phase-Change Memory Applications
AU - Xu, Peng
AU - Meng, Yun
AU - Li, Zhen
AU - Liu, Xiaolin
AU - Zhou, Jian
AU - Song, Sannian
AU - Song, Zhitang
AU - Sun, Zhimei
AU - Wu, Liangcai
N1 - Publisher Copyright:
© 2023 American Chemical Society. All rights reserved.
PY - 2023/5/26
Y1 - 2023/5/26
N2 - High thermal stability, fast operation speed, low thickness variation, and low resistance drift of phase-change nanomaterials are the essential characteristics in phase-change memory (PCM) applications. In this work, we put forward a graphite carbon-doped Sb2Te (C-Sb2Te) chalcogenide with semiconductor process compatibility. Our results prove that the proposed C-Sb2Te has excellent thermal stability and high operation speed. More importantly, the thickness change and resistance drift are only 0.89% and 0.0149, respectively. The C-Sb2Te-based memory device exhibits a high switching speed to the instrument test limit (5 ns) with a large resistance ratio, low operation voltage (2 V), and low power consumption (6.9 pJ). The proposed C-Sb2Te nanostructure material exceeds both conventional Ge2Sb2Te5and transition-metal-doped Sb2Te materials in terms of its performance. Ab initio molecular dynamics simulations reveal that C-C and C-Sb bonds as well as C-C chains are formed in C-Sb2Te, and C doping constrains phase transition in a small region and refines grains of C-Sb2Te, thus resulting in the high performance. Our study suggests that C-Sb2Te is a potential candidate for high-speed, high-thermal-stability, and high-reliability PCM applications.
AB - High thermal stability, fast operation speed, low thickness variation, and low resistance drift of phase-change nanomaterials are the essential characteristics in phase-change memory (PCM) applications. In this work, we put forward a graphite carbon-doped Sb2Te (C-Sb2Te) chalcogenide with semiconductor process compatibility. Our results prove that the proposed C-Sb2Te has excellent thermal stability and high operation speed. More importantly, the thickness change and resistance drift are only 0.89% and 0.0149, respectively. The C-Sb2Te-based memory device exhibits a high switching speed to the instrument test limit (5 ns) with a large resistance ratio, low operation voltage (2 V), and low power consumption (6.9 pJ). The proposed C-Sb2Te nanostructure material exceeds both conventional Ge2Sb2Te5and transition-metal-doped Sb2Te materials in terms of its performance. Ab initio molecular dynamics simulations reveal that C-C and C-Sb bonds as well as C-C chains are formed in C-Sb2Te, and C doping constrains phase transition in a small region and refines grains of C-Sb2Te, thus resulting in the high performance. Our study suggests that C-Sb2Te is a potential candidate for high-speed, high-thermal-stability, and high-reliability PCM applications.
KW - fast switching speed
KW - graphite carbon doping
KW - low power consumption
KW - low resistance drift
KW - low thickness change
KW - phase-change memory
UR - https://www.scopus.com/pages/publications/85161027078
U2 - 10.1021/acsanm.3c01022
DO - 10.1021/acsanm.3c01022
M3 - 文章
AN - SCOPUS:85161027078
SN - 2574-0970
VL - 6
SP - 8668
EP - 8674
JO - ACS Applied Nano Materials
JF - ACS Applied Nano Materials
IS - 10
ER -