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Feasibility of Large-Scale MoS2Thin-Film Transistors on a GaN Substrate

  • Yang Wang
  • , Zheng Hao Gu
  • , Hao Liu
  • , Lin Chen*
  • , Xin Ke Liu
  • , Long Min
  • , Zhi Wen Li
  • , Hao Zhu
  • , Qing Qing Sun
  • *此作品的通讯作者

科研成果: 期刊稿件文章同行评审

摘要

Two-dimensional (2D) materials have attracted much attention for their layered structures and diversity in electronic and optical properties. Sapphire and Si/SiO2 were the most common substrates for chemically synthesized MoS2. Here, we demonstrated high-quality large-scale MoS2 film grown by atomic layer deposition (ALD) on an Fe-doped free-standing GaN substrate. In addition, we fabricated excellent performance and highly uniform top-gate FETs based on MoS2, and the average electron mobility of MoS2 FETs was up to 3.54 cm2 V-1 s-1. Furthermore, Al2O3 was introduced to act as a hard mask to prevent direct contact of photoresist and MoS2, which was compatible for the fabrication process and ensured the homogeneity of electrical properties of each FET. Our work paves a new way for chemically synthesized wafer-scale MoS2 film, and it is promising to build large-scale integrated circuits other than FETs on a GaN substrate.

源语言英语
页(从-至)1418-1423
页数6
期刊ACS Applied Electronic Materials
1
8
DOI
出版状态已出版 - 27 8月 2019
已对外发布

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