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Fault diagnosis methods for advanced diagnostics and prognostics testbed (ADAPT): A review

  • Beihang University
  • Collaborative Innovation Center of Advanced Aero-Engine

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

Nowadays in industrial processes, whether producers or users think highly of performance reliability and robustness of equipments. Therefore, the FDI (Fault detection and isolation) and maintenance techniques have become hot topics for health management of industrial units, as a safety guarantee indeed. As a consequence, researchers have made great efforts to develop, verify and refine diverse diagnosis techniques, meanwhile compare and screening them in order to apply them properly in practice. And then, NASA Ames has built the Advanced Diagnostics and Prognostics Testbed, a real-world system as a general platform for verification and validation (V&V) of diagnosis techniques. Until now, many researchers have developed effective diagnosis algorithms specially applied to this system. In this paper, we introduce the ADAPT and the diagnosis competition around the system, and we review a variety of diagnosis methods divided mainly in three types, model-based, optimization-based and artificial intelligence-based methods, while elaborating the first type in detail by two sorts of model: physical and graphic, of which the second attracts more and more attention of scientists in actual research. Finally, we make a comparison among them based on simplified metrics of qualification, which plays an important role in choosing appropriate methods for diagnosing a special problem.

源语言英语
主期刊名2015 IEEE 12th International Conference on Electronic Measurement and Instruments, ICEMI 2015
编辑Cui Jianping, Wu Juan
出版商Institute of Electrical and Electronics Engineers Inc.
175-180
页数6
ISBN(电子版)9781479976195
DOI
出版状态已出版 - 16 6月 2016
活动12th IEEE International Conference on Electronic Measurement and Instruments, ICEMI 2015 - Qingdao, 中国
期限: 16 7月 201518 7月 2015

出版系列

姓名2015 IEEE 12th International Conference on Electronic Measurement and Instruments, ICEMI 2015
1

会议

会议12th IEEE International Conference on Electronic Measurement and Instruments, ICEMI 2015
国家/地区中国
Qingdao
时期16/07/1518/07/15

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