TY - GEN
T1 - Fatigue Life Prediction Method with Multi-Stress-Ratio Sparse Data
AU - Zu, Tianpei
AU - Yang, Shixi
AU - Lio, Waichon
AU - Zhang, Qingyuan
N1 - Publisher Copyright:
© 2024 IEEE.
PY - 2024
Y1 - 2024
N2 - Rational characterization and quantification of uncertainty are key to fatigue life prediction. And multi-stress ratio sparse fatigue data introduce further effects of epistemic uncertainty to the quantitative characterization of uncertainty. Thus, in this paper, the survival α - S - N curves are firstly defined to express the uncertainty in the relationship of stress level and fatigue life, and the expression for the multi-stress-ratio condition is also clarified. Then the parameter estimation process are established suiting for uncertainty quantification with the sparse fatigue life data. Finally, a case study is used to show the effectiveness of the proposed model and method in the fatigue life prediction with multi-stress-ratio sparse data.
AB - Rational characterization and quantification of uncertainty are key to fatigue life prediction. And multi-stress ratio sparse fatigue data introduce further effects of epistemic uncertainty to the quantitative characterization of uncertainty. Thus, in this paper, the survival α - S - N curves are firstly defined to express the uncertainty in the relationship of stress level and fatigue life, and the expression for the multi-stress-ratio condition is also clarified. Then the parameter estimation process are established suiting for uncertainty quantification with the sparse fatigue life data. Finally, a case study is used to show the effectiveness of the proposed model and method in the fatigue life prediction with multi-stress-ratio sparse data.
KW - S-N curve
KW - fatigue life prediction
KW - multi-stress-ratio
KW - uncertainty quantification
UR - https://www.scopus.com/pages/publications/105003184790
U2 - 10.1109/ICSRS63046.2024.10927555
DO - 10.1109/ICSRS63046.2024.10927555
M3 - 会议稿件
AN - SCOPUS:105003184790
T3 - 2024 8th International Conference on System Reliability and Safety, ICSRS 2024
SP - 730
EP - 735
BT - 2024 8th International Conference on System Reliability and Safety, ICSRS 2024
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 8th International Conference on System Reliability and Safety, ICSRS 2024
Y2 - 20 November 2024 through 22 November 2024
ER -