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Fast Measurement of the Coating Thickness and Conductivity Using Eddy Currents and Plane Wave Approximation

  • Jin Xu
  • , Jing Wu*
  • , Wei Xin
  • , Ziliang Ge
  • *此作品的通讯作者
  • Beihang University
  • China Special Equipment Inspection and Research Institute
  • Beijing Institute of Aeronautical Materials

科研成果: 期刊稿件文章同行评审

摘要

An analytical formula for the electromagnetic field generated by a current-carrying cylindrical coil above a half-infinite conductive plate has been studied. The theoretical analysis showed that when the radius of the coil was much larger than the penetration depth, the electromagnetic wave at the plate surface could be approximated as a plane wave, and the real part of the plane wave impedance would not be affected by lift-off changes. Using normalized plane wave impedances as theoretical values and normalized coil impedances measured by swept-frequency eddy current technique as experimental values, a novel approach is proposed to rapidly and simultaneously solve the coating thickness, coating conductivity and substrate conductivity of a conductive plate with ultra-thin metallic coatings by Levenberg-Marquardt algorithm. The experimental results show that the maximum relative measurement errors of the proposed method for single- and double-coated plates are less than 8% and 18%, respectively, and the measurement time is less than 1 s, which is suitable for fast parameter detection.

源语言英语
文章编号9161015
页(从-至)306-314
页数9
期刊IEEE Sensors Journal
21
1
DOI
出版状态已出版 - 1 1月 2021

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