TY - JOUR
T1 - Exploring Hybrid STT-MTJ/CMOS Energy Solution in Near-/Sub-Threshold Regime for IoT Applications
AU - Cai, Hao
AU - Wang, You
AU - De Barros Naviner, Lirida Alves
AU - Yang, Jun
AU - Zhao, Weisheng
N1 - Publisher Copyright:
© 1965-2012 IEEE.
PY - 2018/2
Y1 - 2018/2
N2 - Emerging memories have been developed to achieve energy efficiency target in the Internet of Things era. Spin transfer torque magnetic tunnel junction (STT-MTJ)-based nonvolatile (NV) memory has demonstrated attractive performance because of zero standby power, reduced switching power, infinite endurance, and high density. Meanwhile, hybrid STT-MTJ/CMOS integration is a promising solution to overcome the bottleneck of dynamic and leakage power dissipation. In this paper, ultralow power methodologies are developed at device and circuit level in 28 nm fully depleted silicon on insulator CMOS technology. Supply voltage scaling, near-/sub-threshold Vt operation, and back-bias adjustment are demonstrated, showing 81% dynamic power reduction under 0.6 V near- Vt sensing operation, with the tradeoff of 6.2% increased sensing error rate. Through the case study on STT-MTJ-based NV flip-flops (NV-FFs), up to 76% dynamic and 79% leakage power saving can be realized in ultra-low power NV-FF implementation.
AB - Emerging memories have been developed to achieve energy efficiency target in the Internet of Things era. Spin transfer torque magnetic tunnel junction (STT-MTJ)-based nonvolatile (NV) memory has demonstrated attractive performance because of zero standby power, reduced switching power, infinite endurance, and high density. Meanwhile, hybrid STT-MTJ/CMOS integration is a promising solution to overcome the bottleneck of dynamic and leakage power dissipation. In this paper, ultralow power methodologies are developed at device and circuit level in 28 nm fully depleted silicon on insulator CMOS technology. Supply voltage scaling, near-/sub-threshold Vt operation, and back-bias adjustment are demonstrated, showing 81% dynamic power reduction under 0.6 V near- Vt sensing operation, with the tradeoff of 6.2% increased sensing error rate. Through the case study on STT-MTJ-based NV flip-flops (NV-FFs), up to 76% dynamic and 79% leakage power saving can be realized in ultra-low power NV-FF implementation.
KW - Flip-flop (FF)
KW - forward back bias (FBB)
KW - fully depleted silicon on insulator (FD-SOI)
KW - magnetic tunnel junction (MTJ)/CMOS integration
KW - near-/sub-threshold
KW - ultralow power
UR - https://www.scopus.com/pages/publications/85040051155
U2 - 10.1109/TMAG.2017.2766220
DO - 10.1109/TMAG.2017.2766220
M3 - 文章
AN - SCOPUS:85040051155
SN - 0018-9464
VL - 54
JO - IEEE Transactions on Magnetics
JF - IEEE Transactions on Magnetics
IS - 2
M1 - 8241796
ER -