TY - GEN
T1 - Experimental Research on Step Stress Accelerated Degradation Test Considering Impacts of Stress Conversion
AU - Xu, Xing
AU - Zhang, Shunong
AU - Shi, Wenwen
AU - Shao, Cong
N1 - Publisher Copyright:
© 2020 IEEE.
PY - 2020/10/16
Y1 - 2020/10/16
N2 - Accelerated degradation test (ADT) is one of the most common methods to assessing product reliability life. Compared with a constant-stress accelerated degradation test (CSADT), the step-stress accelerated degradation test (SSADT) has more significant advantages in reducing experiment costs and shortening the total time; and compared with a sequential accelerated degradation test, it has better operability and controllability. Therefore, SSADT has a wide application prospect. However, the previous research of SSADT does not consider the impacts caused by the stress conversion, or assumes there are no effect. In this paper, an experiment using LED samples to observe the degradation at the moment of stress conversion was designed and conducted. The results show that the impacts of instantaneous stress conversion should be considered in SSADT degradation trajectory modeling.
AB - Accelerated degradation test (ADT) is one of the most common methods to assessing product reliability life. Compared with a constant-stress accelerated degradation test (CSADT), the step-stress accelerated degradation test (SSADT) has more significant advantages in reducing experiment costs and shortening the total time; and compared with a sequential accelerated degradation test, it has better operability and controllability. Therefore, SSADT has a wide application prospect. However, the previous research of SSADT does not consider the impacts caused by the stress conversion, or assumes there are no effect. In this paper, an experiment using LED samples to observe the degradation at the moment of stress conversion was designed and conducted. The results show that the impacts of instantaneous stress conversion should be considered in SSADT degradation trajectory modeling.
KW - Degradation trajectory modeling
KW - Step stress accelerated degradation test
KW - Stress conversion
UR - https://www.scopus.com/pages/publications/85099695638
U2 - 10.1109/PHM-Shanghai49105.2020.9280958
DO - 10.1109/PHM-Shanghai49105.2020.9280958
M3 - 会议稿件
AN - SCOPUS:85099695638
T3 - 2020 Global Reliability and Prognostics and Health Management, PHM-Shanghai 2020
BT - 2020 Global Reliability and Prognostics and Health Management, PHM-Shanghai 2020
A2 - Guo, Wei
A2 - Li, Steven
A2 - Miao, Qiang
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2020 Global Reliability and Prognostics and Health Management, PHM-Shanghai 2020
Y2 - 16 October 2020 through 18 October 2020
ER -