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Experimental and FEM study of hygro-thermo reliability of FCPBGA

  • Weijia Li*
  • , Yonghui Gong
  • , Fei Su
  • *此作品的通讯作者
  • Beihang University

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

In this paper, hygro-thermal deformations of a flip-chip-plastic-ball-grid- array (FCPBGA) package are tested using a 3-D optical testing system. It is found that the warpage of the FCPBGA package can even be reversed by moisture absorption of plastic materials. To investigate the thermal stress field of the FCPBGA and its change due to moisture absorption, finite element method (FEM) was employed, the experimental results are used to verify and modify the FEM models. With the FEM simulation,it is verified that the residual stress field of the FCPBGA can be changed greatly by moisture absorption, especially, a high peel stress occurred to the solder balls, which can be used to illustrate the failure mode of UBM opening. Through the simulation and investigation, a usually neglected reliability problem due to moisture absorption is revealed.

源语言英语
主期刊名ICEPT-HDP 2012 Proceedings - 2012 13th International Conference on Electronic Packaging Technology and High Density Packaging
1114-1119
页数6
DOI
出版状态已出版 - 2012
活动2012 13th International Conference on Electronic Packaging Technology and High Density Packaging, ICEPT-HDP 2012 - Guilin, 中国
期限: 13 8月 201216 8月 2012

出版系列

姓名ICEPT-HDP 2012 Proceedings - 2012 13th International Conference on Electronic Packaging Technology and High Density Packaging

会议

会议2012 13th International Conference on Electronic Packaging Technology and High Density Packaging, ICEPT-HDP 2012
国家/地区中国
Guilin
时期13/08/1216/08/12

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