Evaluation and analysis of reliability of ARM based embedded systems tested by reliability enhancement test

Reliability enhancement test (RET) can not directly produce a meaningful reliability parameter through the test results due to the limitation of its methodology. This paper develops an engineering suitable approach for evaluating the reliability of the outfield products, which adopts the vibration stress-strength model and the theoretical statistic approach. On the basis of the RET results of a set of ARM micro processor based embedded system, the reliability of the system in the field vibration environment is calculated by means of the derived method, which proves that the approach can be a guidance to improve the reliability of products.