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EMI Response of Microcontroller I/O Ports under Different Input Modes

  • Shukai Li
  • , Bing Li*
  • *此作品的通讯作者
  • Beihang University

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

To investigate the response pattern of embedded microcontrollers to conducted electromagnetic interference (EMI), EMI response experiments were performed using the direct power injection (DPI) method. By injecting singlefrequency continuous signals, the microcontroller's ability to identify and respond to signals above the power frequency was tested. The results indicate that in pull-up input mode, for singlefrequency signals greater than 100 MHz, the probability of the microcontroller recognizing a low logic level can significantly exceed 50%, even reaching 100%. The responses are asymmetric between pull-up and pull-down input modes. Significant waveform distortion is observed in the pull-up input mode, whereas no such distortion is found in the pull-down input mode. These findings are significant for analyzing the EMI response of circuit systems centered around embedded microcontrollers.

源语言英语
主期刊名Proceedings - 2025 Cross Strait Radio Science and Wireless Technology Conference, CSRSWTC 2025
出版商Institute of Electrical and Electronics Engineers Inc.
ISBN(电子版)9798331577117
DOI
出版状态已出版 - 2025
活动2025 Cross Strait Radio Science and Wireless Technology Conference, CSRSWTC 2025 - Guangzhou, 中国
期限: 14 11月 202516 11月 2025

出版系列

姓名Proceedings - 2025 Cross Strait Radio Science and Wireless Technology Conference, CSRSWTC 2025

会议

会议2025 Cross Strait Radio Science and Wireless Technology Conference, CSRSWTC 2025
国家/地区中国
Guangzhou
时期14/11/2516/11/25

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