摘要
Single-walled carbon nanotubes (SWNTs) are promising building blocks for nanoelectronics. However, because of the mixture of metallic and semiconducting single-walled carbon nanotubes (m-SWNTs and s-SWNTs), it is necessary to identify them for nanodevice integerations. In this work, we have observed obvious electrodeposition differences of ultralong m-SWNTs and s-SWNTs. Using high-resolution atomic force microscopy (AFM) and field emission scanning electron microscopy (FE-SEM), particle densities along different carbon nanotubes were examined. Interestingly, m-SWNTs and s-SWNTs showed obviously different deposition behaviors, i.e., exponential decay of particle densities with different decay coefficients. This electrochemical approach can be used for a simple identification of m-SWNTs and s-SWNTs.
| 源语言 | 英语 |
|---|---|
| 页(从-至) | 13346-13348 |
| 页数 | 3 |
| 期刊 | Journal of Physical Chemistry C |
| 卷 | 112 |
| 期 | 35 |
| DOI | |
| 出版状态 | 已出版 - 4 9月 2008 |
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