Electrical transport across metal/two-dimensional carbon junctions: Edge versus side contacts

Yihong Wu; Ying Wang; Jiayi Wang; Miao Zhou; Aihua Zhang; Chun Zhang; Yanjing Yang; Younan Hua; Baoxi Xu

doi:10.1063/1.3684617

Electrical transport across metal/two-dimensional carbon junctions: Edge versus side contacts

Yihong Wu^*
, Ying Wang
, Jiayi Wang
, Miao Zhou
, Aihua Zhang
, Chun Zhang
, Yanjing Yang
, Younan Hua
, Baoxi Xu

^*此作品的通讯作者

National University of Singapore
Global Foundries, Inc.

科研成果: 期刊稿件 › 文章 › 同行评审

10 引用（Scopus）

摘要

Metal/two-dimensional carbon junctions are characterized by using a nanoprobe in an ultrahigh vacuum environment. Significant differences were found in bias voltage (V) dependence of differential conductance (dI/dV) between edge- and side-contact; the former exhibits a clear linear relationship (i.e., dI/dV αV), whereas the latter is characterized by a nonlinear dependence, dI/dV αV^3/2. Theoretical calculations confirm the experimental results, which are due to the robust two-dimensional nature of the carbon materials under study. Our work demonstrates the importance of contact geometry in graphene-based electronic devices.

源语言	英语
文章编号	012132
期刊	AIP Advances
卷	2
期	1
DOI	https://doi.org/10.1063/1.3684617
出版状态	已出版 - 3月 2012
已对外发布	是

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abstract = "Metal/two-dimensional carbon junctions are characterized by using a nanoprobe in an ultrahigh vacuum environment. Significant differences were found in bias voltage (V) dependence of differential conductance (dI/dV) between edge- and side-contact; the former exhibits a clear linear relationship (i.e., dI/dV αV), whereas the latter is characterized by a nonlinear dependence, dI/dV αV3/2. Theoretical calculations confirm the experimental results, which are due to the robust two-dimensional nature of the carbon materials under study. Our work demonstrates the importance of contact geometry in graphene-based electronic devices.",

author = "Yihong Wu and Ying Wang and Jiayi Wang and Miao Zhou and Aihua Zhang and Chun Zhang and Yanjing Yang and Younan Hua and Baoxi Xu",

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AU - Wu, Yihong

AU - Wang, Ying

AU - Wang, Jiayi

AU - Zhou, Miao

AU - Zhang, Aihua

AU - Zhang, Chun

AU - Yang, Yanjing

AU - Hua, Younan

AU - Xu, Baoxi

PY - 2012/3

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AB - Metal/two-dimensional carbon junctions are characterized by using a nanoprobe in an ultrahigh vacuum environment. Significant differences were found in bias voltage (V) dependence of differential conductance (dI/dV) between edge- and side-contact; the former exhibits a clear linear relationship (i.e., dI/dV αV), whereas the latter is characterized by a nonlinear dependence, dI/dV αV3/2. Theoretical calculations confirm the experimental results, which are due to the robust two-dimensional nature of the carbon materials under study. Our work demonstrates the importance of contact geometry in graphene-based electronic devices.

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Electrical transport across metal/two-dimensional carbon junctions: Edge versus side contacts

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