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Effects of PWB design factors on PTH reliability

  • Ying Chen*
  • , Yujie Huo
  • , Jingsong Xie
  • , Yuan Zhang
  • *此作品的通讯作者
  • Beihang University
  • Huawei Technologies Co., Ltd.

科研成果: 期刊稿件文章同行评审

摘要

Based on the barrel stress distribution model, the effect of printed wiring board (PWB) design factors such as plated through-hole (PTH) aspect ratio, the ratio of plating thickness over PTH radius, the ratio of board influence radius over PTH radius and glass transition temperature on PTH barrel stress and lifetime were studied quantitatively. Equivalent temperature load was introduced to found the barrel stress distribution model under different glass transition temperature. Results show that PTH life is sensitive to design factors when PWB operating at vicinities of the yielding temperature load. The PTH aspect ratio shows more significant impact when fixing the ratio of board influence radius over PTH radius. For the fixed PWB thickness, decrease PTH diameter results in the increase of PTH barrel stress and the decrease of PTH lifetime. PTH barrel strain sharply increases at the glass transition temperature. Results also show that the constant strain concentration coefficient is different in elastic and plastic stage.

源语言英语
页(从-至)954-958
页数5
期刊Beijing Hangkong Hangtian Daxue Xuebao/Journal of Beijing University of Aeronautics and Astronautics
33
8
出版状态已出版 - 8月 2007

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