摘要
The effects of an NiFe/MgO interface on the thermoelectric transport behavior of spin-polarized electrons were studied by measuring the Seebeck coefficient (S) and anisotropic magneto-thermopower (AMT) of an MgO/NiFe/MgO multilayer structure. Thermally annealing this multilayer was found to increase S (343% at 450 °C) through crystallization of interfacial MgO, which allows conductive electrons to achieve better specular scattering at the interface. The AMT was also increased by annealing (139% at 450 °C), but this is ascribed to a chemical metallization of interfacial Fe in which the deposition-induced oxygen atoms migrate out of the NiFe layer. This helps to recover the magnetization of NiFe, thereby causing spin-dependent thermoelectric transport behavior at the interface.
| 源语言 | 英语 |
|---|---|
| 页(从-至) | 351-353 |
| 页数 | 3 |
| 期刊 | Materials Letters |
| 卷 | 137 |
| DOI | |
| 出版状态 | 已出版 - 15 12月 2014 |
| 已对外发布 | 是 |
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