TY - GEN
T1 - Effect of finite aperture on Interferometric Surface Plasmon microscopic sensing performance
AU - Zhang, Bei
AU - Yan, Peng
AU - Wang, Le
AU - Zhang, Chengqian
N1 - Publisher Copyright:
© 2016 IEEE.
PY - 2016/11/3
Y1 - 2016/11/3
N2 - Interferometric Surface Plasmons (SPs) microscopic sensing can be used to measure the thickness or refractive index variation of nanomaterial within the order of diffraction limit in the lateral directions. However experimental results in literatures have shown the technique suffers from severely low signal to noise ratio (SNR) which limits its practical resolution and may cause failure of the technique in some hostile environment. In this paper, we study the effect of finite numerical aperture (NA) on the interferometric SPs sensing performance and explore the possibility of imposing proper pupil apodization functions to suppress the effect. We also propose a TM-only mode apodization filter to further improve the sensing performance of the interferometric SPs microscopy.
AB - Interferometric Surface Plasmons (SPs) microscopic sensing can be used to measure the thickness or refractive index variation of nanomaterial within the order of diffraction limit in the lateral directions. However experimental results in literatures have shown the technique suffers from severely low signal to noise ratio (SNR) which limits its practical resolution and may cause failure of the technique in some hostile environment. In this paper, we study the effect of finite numerical aperture (NA) on the interferometric SPs sensing performance and explore the possibility of imposing proper pupil apodization functions to suppress the effect. We also propose a TM-only mode apodization filter to further improve the sensing performance of the interferometric SPs microscopy.
UR - https://www.scopus.com/pages/publications/85006778555
U2 - 10.1109/PIERS.2016.7734487
DO - 10.1109/PIERS.2016.7734487
M3 - 会议稿件
AN - SCOPUS:85006778555
T3 - 2016 Progress In Electromagnetics Research Symposium, PIERS 2016 - Proceedings
SP - 818
EP - 822
BT - 2016 Progress In Electromagnetics Research Symposium, PIERS 2016 - Proceedings
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2016 Progress In Electromagnetics Research Symposium, PIERS 2016
Y2 - 8 August 2016 through 11 August 2016
ER -