Dual-frequency atomic force microscopy imaging method and experiment based on commercial AFM platform

Wei Wang; Jian Qiang Qian; Ying Zi Li; Zhu Li Chen

doi:10.1088/0256-307X/30/6/060702

Dual-frequency atomic force microscopy imaging method and experiment based on commercial AFM platform

Wei Wang
, Jian Qiang Qian^*
, Ying Zi Li
, Zhu Li Chen

^*此作品的通讯作者

物理学院

Beihang University

科研成果: 期刊稿件 › 文章 › 同行评审

1 引用（Scopus）

摘要

A dual-frequency atomic force microscopy imaging system is set up to enhance the amplitude of higher harmonic signals. The experimental results of the dual-frequency imaging technology are given. Normally the image of the higher harmonic is helpful to optimize the imaging conditions in tapping mode and allows one to differentiate qualitatively between dissimilar materials that are hardly distinguishable by traditional atomic force microscopy.

源语言	英语
文章编号	060702
期刊	Chinese Physics Letters
卷	30
期	6
DOI	https://doi.org/10.1088/0256-307X/30/6/060702
出版状态	已出版 - 6月 2013

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title = "Dual-frequency atomic force microscopy imaging method and experiment based on commercial AFM platform",

abstract = "A dual-frequency atomic force microscopy imaging system is set up to enhance the amplitude of higher harmonic signals. The experimental results of the dual-frequency imaging technology are given. Normally the image of the higher harmonic is helpful to optimize the imaging conditions in tapping mode and allows one to differentiate qualitatively between dissimilar materials that are hardly distinguishable by traditional atomic force microscopy.",

author = "Wei Wang and Qian, \{Jian Qiang\} and Li, \{Ying Zi\} and Chen, \{Zhu Li\}",

year = "2013",

month = jun,

doi = "10.1088/0256-307X/30/6/060702",

language = "英语",

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AU - Wang, Wei

AU - Qian, Jian Qiang

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N2 - A dual-frequency atomic force microscopy imaging system is set up to enhance the amplitude of higher harmonic signals. The experimental results of the dual-frequency imaging technology are given. Normally the image of the higher harmonic is helpful to optimize the imaging conditions in tapping mode and allows one to differentiate qualitatively between dissimilar materials that are hardly distinguishable by traditional atomic force microscopy.

AB - A dual-frequency atomic force microscopy imaging system is set up to enhance the amplitude of higher harmonic signals. The experimental results of the dual-frequency imaging technology are given. Normally the image of the higher harmonic is helpful to optimize the imaging conditions in tapping mode and allows one to differentiate qualitatively between dissimilar materials that are hardly distinguishable by traditional atomic force microscopy.

UR - https://www.scopus.com/pages/publications/84879908528

U2 - 10.1088/0256-307X/30/6/060702

DO - 10.1088/0256-307X/30/6/060702

M3 - 文章

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VL - 30

JO - Chinese Physics Letters

JF - Chinese Physics Letters

IS - 6

M1 - 060702

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Dual-frequency atomic force microscopy imaging method and experiment based on commercial AFM platform

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