摘要
A dual axis small angle measuring method is introduced, which uses optics self-collimating structure and quadrant Si-photoelectric detector. The result affected by beam spot size is analyzed. In order to improve the instrument's reliability and precision, AC modulating method and track signal processing are used. Special demarcation equipment is designed. First, the relation between the small angle and the output voltage is measured. Secondly the curve is calculated, and it is saved in single chip microcomputer. The instrument can display the angle, and relate with computer. The equipment has a simple structure and high precision.
| 源语言 | 英语 |
|---|---|
| 页(从-至) | 176-178 |
| 页数 | 3 |
| 期刊 | Guangxue Jishu/Optical Technique |
| 卷 | 30 |
| 期 | 2 |
| 出版状态 | 已出版 - 3月 2004 |
| 已对外发布 | 是 |
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