TY - GEN
T1 - Double-Stress Accelerated Degradation Modeling Based on Uncertain Process
AU - Wang, Huan
AU - Xu, Dan
N1 - Publisher Copyright:
© 2022 IEEE.
PY - 2022
Y1 - 2022
N2 - Accelerated degradation test (ADT) plays an important role in products reliability evaluation and lifetime prediction. When less data is obtained, the traditional method based on probability theory has some defects in the cognitive uncertainty of quantitative data. Therefore, based on the uncertainty theory and belief reliability theory, this paper establishes a new uncertainty accelerated degradation model, which takes into account the cognitive uncertainty of time, sample, and double stress dimensions at the same time. Then, the parameter estimation method of the model is given based on the least square principle. Finally, take the temperature and humidity stress ADT of the sealing rubber ring as an example, establish double-stress accelerated degradation model and evaluate its reliability.
AB - Accelerated degradation test (ADT) plays an important role in products reliability evaluation and lifetime prediction. When less data is obtained, the traditional method based on probability theory has some defects in the cognitive uncertainty of quantitative data. Therefore, based on the uncertainty theory and belief reliability theory, this paper establishes a new uncertainty accelerated degradation model, which takes into account the cognitive uncertainty of time, sample, and double stress dimensions at the same time. Then, the parameter estimation method of the model is given based on the least square principle. Finally, take the temperature and humidity stress ADT of the sealing rubber ring as an example, establish double-stress accelerated degradation model and evaluate its reliability.
KW - Accelerated degradation test
KW - belief reliability assessment
KW - double stress cognitive uncertainty
KW - sealing rubber ring
KW - uncertain process
UR - https://www.scopus.com/pages/publications/85134887947
U2 - 10.1109/PHM2022-London52454.2022.00100
DO - 10.1109/PHM2022-London52454.2022.00100
M3 - 会议稿件
AN - SCOPUS:85134887947
T3 - Proceedings - 2022 Prognostics and Health Management Conference, PHM-London 2022
SP - 534
EP - 538
BT - Proceedings - 2022 Prognostics and Health Management Conference, PHM-London 2022
A2 - Li, Chuan
A2 - Valentino, Gianluca
A2 - Kang, Ling
A2 - Cabrera, Diego
A2 - Gjorgjevikj, Dejan
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2022 Prognostics and Health Management Conference, PHM-London 2022
Y2 - 27 May 2022 through 29 May 2022
ER -