Discussion about seal test of electronics in GJB

Dandan Zhang; Jianwen Wu

Discussion about seal test of electronics in GJB

Dandan Zhang^*
, Jianwen Wu

^*此作品的通讯作者

自动化科学与电气工程学院

Beihang University

科研成果: 期刊稿件 › 文章 › 同行评审

摘要

The problems about sealing test of electronics in GJB were analyzed. Improved methods were presented, which provide the references for controlling the seal quality of military products. Failure data from a seal test performed by some factory are given to illustrate the importance of strictly controlling test conditions.

源语言	英语
页（从-至）	173-176
页数	4
期刊	Beijing Hangkong Hangtian Daxue Xuebao/Journal of Beijing University of Aeronautics and Astronautics
卷	30
期	2
出版状态	已出版 - 2月 2004

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@article{4918ff5ba9be4a0890a1341c56347408,

title = "Discussion about seal test of electronics in GJB",

abstract = "The problems about sealing test of electronics in GJB were analyzed. Improved methods were presented, which provide the references for controlling the seal quality of military products. Failure data from a seal test performed by some factory are given to illustrate the importance of strictly controlling test conditions.",

keywords = "Fine leak, GJB, Leak rate, Reliability, Sealing",

author = "Dandan Zhang and Jianwen Wu",

year = "2004",

month = feb,

language = "英语",

volume = "30",

pages = "173--176",

journal = "Beijing Hangkong Hangtian Daxue Xuebao/Journal of Beijing University of Aeronautics and Astronautics",

issn = "1001-5965",

publisher = "Beijing University of Aeronautics and Astronautics (BUAA)",

number = "2",

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T1 - Discussion about seal test of electronics in GJB

AU - Zhang, Dandan

AU - Wu, Jianwen

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N2 - The problems about sealing test of electronics in GJB were analyzed. Improved methods were presented, which provide the references for controlling the seal quality of military products. Failure data from a seal test performed by some factory are given to illustrate the importance of strictly controlling test conditions.

AB - The problems about sealing test of electronics in GJB were analyzed. Improved methods were presented, which provide the references for controlling the seal quality of military products. Failure data from a seal test performed by some factory are given to illustrate the importance of strictly controlling test conditions.

KW - Fine leak

KW - GJB

KW - Leak rate

KW - Reliability

KW - Sealing

UR - https://www.scopus.com/pages/publications/3042842854

M3 - 文章

AN - SCOPUS:3042842854

SN - 1001-5965

VL - 30

SP - 173

EP - 176

JO - Beijing Hangkong Hangtian Daxue Xuebao/Journal of Beijing University of Aeronautics and Astronautics

JF - Beijing Hangkong Hangtian Daxue Xuebao/Journal of Beijing University of Aeronautics and Astronautics

IS - 2

ER -

Discussion about seal test of electronics in GJB

摘要

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